Chapter 6: Glossary
Accumulation of free carriers in a semiconductor
Back contact of a MOSFET also referred to as the substrate contact.
Capacitance versus voltage measurement
Characteristic length over which the carrier density in a semiconductor changes by a factor e
Energy band diagram of a MOS capacitor containing no net charge in the semiconductor
Change of carrier type in a semiconductor obtained by applying an external voltage. In a MOSFET, inversion creates the free carriers, which cause the drain current.
The layer of free carriers of opposite type at the semiconductor-oxide interface of a MOSFET