Chapter 6: Glossary

Name

Accumulation

Accumulation of free carriers in a semiconductor

Bulk

Back contact of a MOSFET also referred to as the substrate contact.

C-V measurement

Capacitance versus voltage measurement

Debye length

Characteristic length over which the carrier density in a semiconductor changes by a factor e

Flatband diagram

Energy band diagram of a MOS capacitor containing no net charge in the semiconductor

Inversion

Change of carrier type in a semiconductor obtained by applying an external voltage. In a MOSFET, inversion creates the free carriers, which cause the drain current.

Inversion layer

The layer of free carriers of opposite type at the semiconductor-oxide interface of a MOSFET