Course outline

This outline will be updated during the semester. The page numbers refer to the textbook.

 Date Lecture topicWeb bookText bookHW due
M8/22/20051IntroductionForeword 1.1 1.2 1.3 1.4   
W8/24/20052Physics of semiconductor materials2.1 2.2 1-14 
F8/26/20053Physics of semiconductor materials2.31-14 
M8/29/20054Thermal equilibrium statistics2.4 2.514-26 
W8/31/20055Free carriers in semiconductors2.6 2.726-35 
F9/2/20056Diffusion of carriers2.735-38#1
M9/5/2005 Labor day   
W9/7/20057The Hall effect;Quasi-Ferm energies2.7.538-44 
F9/9/20058Silicon Technology; sheet resistance 55-117
128-134
#2
M9/12/20059Metal-Semionductor junctions; electrostatic analysis3.1 3.2 3.3139-150 
W9/14/200510Metal-Semionductor junction current; current derivation3.4152-155
158-166
 
F9/16/200511M-S junction issues; barrier lowering; Schottky diode with an interfacial layer3.3.6150-151#3
M9/19/200512Exact solution
Contacts, surface effects and Schottky diodes
3.5 3.3.7166-169 
W9/21/200513MESFETs and HEMTs3.6219-221 
F9/23/200514p-n Junctions 174-194#4
M9/26/200515Reverse-Biased pn Junctions4.5198-212 
W9/28/200516The Junction Field-Effect Transistor 212-219 
F9/30/200517The Continuity Equation2.9226-228#5
M10/3/200518Generation and Recombination of free carriers2.8228-238 
W10/5/200519Ideal diode current derivation4.4.2238-247 
F10/7/200520Recombination-Generation current in the depletion region4.4.3
4.4.4
247-251#6
M10/10/200521Optoelectronic devices; Light absorption and emission4.6  
W10/12/200522Photodiodes and Solar cells4.7
4.8
  
F10/14/2005 Fall Break   
M10/17/200523LEDs and laser diodes4.9
4.10
  
W10/19/200524Review   
F10/21/2005 Midterm exam   
M10/24/200525Bipolar transistor; structure and principle of operation5.1
5.2
278-296 
W10/26/200526The ideal transistor model
Lecture taped on Friday at 10am
5.3296-304 
F10/28/200527Non-ideal effects in bipolar transistors5.4324-342 
M10/31/200528Charge control,model, small signal model5.5
5.6
342-368#7
W11/2/200529Bipolar fabrication technology and HBTs and Power Devices5.7
5.8
5.9
305-320
368-374
 
F11/4/200530The MOS capacitor: Structure and principle of operation6.1
6.2
380-390#8
M11/7/200531MOS Electrostatic analysis6.3390-396 
W11/9/200532MOS capacitance6.3.4396-413 
F11/11/200533Exact MOS analysis6.5 #9
M11/14/200534The MOSFET7.1
7.2
7.3.1
7.3.2
426-430 
W11/16/2005 No Class   
F11/18/200535The variable depletion layer model7.3.3431-435#10
M11/21/200536MOSFET Threshold voltage, The substrate bias effect, SPICE Model 435-443 
W11/23/200537MOSFET Technology 446-447 
F11/25/2005 Thanksgiving   
M11/28/200538MOSFET memory circuits 447-461 
W11/30/200539CMOS  461-475 
F12/2/200540Advanced MOSFET issues  #11
M12/5/200541MOS Power Devices   
W12/7/2005 No lecture   
M12/12/2005 Final Exam (1:30pm-4:00pm)