|
ADDITIONAL TECHNOLOGY (EARLIER LAB WORK)
Lab Publications
v
“Light
modulating eyewear assembly,” Garret Moddel, and Stephen Shear, U.S. Patent
No. 6,760,080, issued 2004.
v
"Fractional bandwidth normalization for
optical spectra with application to the solar blackbody spectrum," G.
Moddel, Appl. Optics, 40,
413-416 (2001).
v
"Fixed-polarizer ellipsometry: a simple
technique to measure the thickness of very thin films," B. Trotter, G.
Moddel, R. Ostroff, and G. R. Bogart, Opt. Engr., 38, 902-907 (1999).
v
“Liquid
crystal eyewear with two identical guest host subcells and tilted homeotropic
alignment”, Garret Moddel and David Doroski, U.S. Patent No. 5,943,104,
issued 1999.
v
"Fixed
polarizer ellipsometry for simple and sensitive detection of thin films
generated by specific molecular interactions: applications in immunoassays
and DNA sequence detection," R. M. Ostroff, D. Maul, G. R. Bogart, S.
Yang, J. Christian, D. Hopkins, K. Clark, B. Trotter, and G. Moddel, Clinical
Chem., 44,
2031-2035 (1998).
v
"Visible photoluminescence from porous
a-Si:H and porous a-Si:C:H thin films," M. J. Estes, L. R. Hirsch, S.
Wichart, G. Moddel, and D. L. Williamson, J. Appl. Phys., 82, 1832-1840 (1997).
v
“Electro-optic
wedge structure for beam steering and method of manufacture,” Garret Moddel,
John Wootton, Gary Waldman, David Holder, U.S. Patent No. 5,615,029, issued
1997.
v
"Characterization
of the visible photoluminescence from anodized porous a-Si:H and a-Si:C:H
thin films," M. J. Estes, L. R. Hirsch, S. Wichart, and G. Moddel, Amorphous
Silicon Technology - 1996, M,
Hack, E, A. Schiff, S, Wagner, R, Schropp, and A, Matsuda, ed., Vol. 420
(Materials Research Society, Pittsburgh, 1996) pp. 831-836.
v
"Luminescence from amorphous silicon
nanostructures," M. J. Estes, and G. Moddel, Phy. Rev. B15, 54, 14,633-14,642 (1996).
v
"A model of size-dependent
photoluminescence in amorphous silicon nanostructures: comparison with
observations of porous silicon," M. J. Estes and G. Moddel, Appl. Phys.
Lett., 68, 1814-1816 (1996).
|